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SURFACE ANALYTICAL METHODS AS A POWERFUL TOOL IN DEVELOPMENT OF MODIFIED SURFACES FOR BIOSENSORS

Kerfin, Wolfgang
; 
Plog, Carsten
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Issue Date
1989
Submitted date
2024-01-16
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Abstract
It could be shown, that the thickness of layers and the chemical composition of unmodified and modified silicon surfaces can be well analyzed by Secondary Ion Mass Spectrometry (SIMS). The interpretation of the results gives helpful hints for design of surface layers useful for biosensor development.
Citation
Biosensors : applications in medicine, environmental protection and process control, 389 - 394
Affiliation
Dornier GmbH, Postbox 1420, D-7990 Friedrichshafen 1
Publisher
GBF Gesellschaft für Biotechnologische Forschung mbH, Braunschweig
Journal
Biosensors : applications in medicine, environmental protection and process control, 1989
URI
http://hdl.handle.net/10033/623599
DOI
PubMed ID
PubMed Central ID
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Type
Book chapter
conference paper
Language
en
Description
Series/Report no.
GBF monographs ; Volume 13
ISSN
0930-4320
EISSN
ISBN
3527280324
0895739550
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License
Attribution-NonCommercial-ShareAlike 4.0 International
cbn
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