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dc.contributor.authorKerfin, Wolfgang
dc.contributor.authorPlog, Carsten
dc.date.accessioned2024-01-16T12:15:50Z
dc.date.available2024-01-16T12:15:50Z
dc.date.issued1989
dc.date.submitted2024-01-16
dc.identifier.citationBiosensors : applications in medicine, environmental protection and process control, 389 - 394en_US
dc.identifier.isbn3527280324
dc.identifier.isbn0895739550
dc.identifier.issn0930-4320
dc.identifier.urihttp://hdl.handle.net/10033/623599
dc.description.abstractIt could be shown, that the thickness of layers and the chemical composition of unmodified and modified silicon surfaces can be well analyzed by Secondary Ion Mass Spectrometry (SIMS). The interpretation of the results gives helpful hints for design of surface layers useful for biosensor development.en_US
dc.language.isoenen_US
dc.publisherGBF Gesellschaft für Biotechnologische Forschung mbH, Braunschweigen_US
dc.relation.ispartofseriesGBF monographs ; Volume 13en_US
dc.rightsAttribution-NonCommercial-ShareAlike 4.0 International*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/*
dc.titleSURFACE ANALYTICAL METHODS AS A POWERFUL TOOL IN DEVELOPMENT OF MODIFIED SURFACES FOR BIOSENSORSen_US
dc.typeBook chapteren_US
dc.typeconference paperen_US
dc.contributor.departmentDornier GmbH, Postbox 1420, D-7990 Friedrichshafen 1en_US
dc.identifier.journalBiosensors : applications in medicine, environmental protection and process control, 1989en_US
refterms.dateFOA2024-01-16T12:15:52Z


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Attribution-NonCommercial-ShareAlike 4.0 International
Except where otherwise noted, this item's license is described as Attribution-NonCommercial-ShareAlike 4.0 International